A minor correction to make is that early on you mention you're going to use an E6600 to demonstrate with, but the CPUZ screenshot later shows an E4300. I have a habit of noticing things like this
Also, I came across the following thread on another forum which discusses the relative pros/cons of using TAT for stress testing. Effectively, TAT is the most extreme form of CPU stress testing possible (due to it "exercising" all transistors) and so if used you should not be too worried with higher than normal temps (eg. up to 70C). It is a good test of your cooling solution(s), along with being handy for hot/cold burn-in cycles (eg. to bed in thermal compound). One of it's design goals was apparently to test the throttling mechanisms of CPU's (particularly notebook CPU's)
http://www.cdrinfo.com/Sections/Revi...9655&PageId=15